Microstructure evolution in Cu thin films, investigated by ab-initio and level set modeling

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Microstructure evolution in Cu thin films, investigated by ab-initio and level set modeling

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Publication Conference other
Title Microstructure evolution in Cu thin films, investigated by ab-initio and level set modeling
Author(s) Hallberg, Håkan ; Olsson, Pär
Date 2016
Conference
The 24th International Congress on Theoretical and Applied Mechanics (ICTAM XXIV) ,Montreal, Canada ,August 21-27, 2016
Pages 1-2
Language eng (iso)
Subject(s) Sciences
Research Subject Categories::TECHNOLOGY
Handle http://hdl.handle.net/2043/21209 Permalink to this page
Link http://www.ictam2016.org/welcome_e.shtml (external link to related web page)

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