Preparation for TEM of latered samples with fragile microstructure and weak layer interface

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Preparation for TEM of latered samples with fragile microstructure and weak layer interface

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Publication Article, peer reviewed scientific
Title Preparation for TEM of latered samples with fragile microstructure and weak layer interface
Author(s) Wei, Liu-Ying ; Westman, AK ; Barre, F
Date 1999
Host/Issue Microscopy Research and Technique
Pages 45, 198 - 202
Language swe (iso)
Subject(s) Technology
Handle http://hdl.handle.net/2043/4809 Permalink to this page

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