Application Specific Integrated Circuit (ASIC) Readout Technologies for Future Ion Beam Analytical Instruments

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Application Specific Integrated Circuit (ASIC) Readout Technologies for Future Ion Beam Analytical Instruments

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Publication Article, peer reviewed scientific
Title Application Specific Integrated Circuit (ASIC) Readout Technologies for Future Ion Beam Analytical Instruments
Author(s) Whitlow, Harry J
Date 2000
English abstract
New possibilities for ion beam analysis (IBA) are afforded by recent developments in detector technology which facilitate the parallel collection of data from a large number of channels. Application specific integrated circuit (ASIC) technologies, which have been widely employed for multi-channel readout systems in nuclear and particle physics, are more net-cost effective (160 /channel for 1000 channels) and a more rational solution for readout of a large number of channels than afforded by conventional electronics. Based on results from existing and on-going chip designs, the possibilities and issues of ASIC readout technology are considered from the IBA viewpoint. Consideration is given to readout chip architecture and how the stringent resolution, linearity and stability requirements for IBA may be met. In addition the implications of the restrictions imposed by ASIC technology are discussed.
DOI http://dx.doi.org/10.1016/S0168-583X(99)00709-0 (link to publisher's fulltext)
Host/Issue Nuclear instruments & methods in physics research Section B
Volume 161-163
ISSN 0168-583X
Pages 281-286
Language eng (iso)
Subject(s) Application specific integrated circuit
Detectors
Ion beam analysis
Charge sensitive amplifiers
Shapers
Data acquisition
Multi-channel signal processing
Handle http://hdl.handle.net/2043/562 (link to this page)

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