The Response and Calibration of Thin Si dE Detectors

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The Response and Calibration of Thin Si dE Detectors

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Publication Article, peer reviewed scientific
Title The Response and Calibration of Thin Si dE Detectors
Author(s) Zhang, Y ; Whitlow, Harry J ; Winzell, T
Date 1999
English abstract
The response of thin (~7 m) self-supporting Si p-i-n E detectors for light recoils (Z 8) has been characterised using a conventional Elastic Recoil Detection (ERD) set-up. In this study, the energy loss of each recoil in the E detector was measured by determining the incident energy from the time of flight and the energy after traversing the E detector using a thick (280 m) Si p-i-n diode E detector. 40 MeV 35Cl7+ ions were used to produce recoils of H, Li, Be, B, C, N and O. Correlation of the energy loss in the E detector with the amplitude of the E signals was used to assign calibration constants. Analysis of the variance of the signals from the trend line revealed that the standard deviation of the data perpendicular to the trend line which is not contributed to by energy straggling and multiple scattering, increases with increasing recoil atomic number.
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Host/Issue Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1-2
Volume 159
ISSN 0168-583X
Pages 101-110
Language eng (iso)
Subject(s) Delta-E detectors
P-i-n diodes
Energy loss
Time of flight
Elastic Recoil Detection (ERD)
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